Microscale Metallography Using Focused Ion Beam

Microscale Metallography Using Focused Ion Beam

Microstructural examination can provide a rich tapestry of information about the processing and application history of a metal component. For this reason, microstructural characterization is a fundamental tool for failure analysis of these components. To reduce costs and accommodate demands for smaller packaging, many applications currently use metallic components where the critical dimensions ...

Sculpting on polymers using focused ion beam

Available online 13 June 2008 It has been recently shown t

Focused Ion Beam Lithography

Imaging Nanophotonic Modes of Microresonators using a Focused Ion Beam.

Optical microresonators have proven powerful in a wide range of applications, including cavity quantum electrodynamics1-3, biosensing4, microfludics5, and cavity optomechanics6-8. Their performance depends critically on the exact distribution of optical energy, confined and shaped by the nanoscale device geometry. Near-field optical probes9 can image this distribution, but the physical probe ne...

Extraction and Analysis of Microcrater Residues Using Focused Ion Beam

Introduction: Microcraters within Stardust aluminium foils have the potential to trap impact residues – probably molten or partially vapourised – of comet Wild 2 material [1]. Thus, in addition to the cometary particles captured by aerogel, microcraters may also reveal compositional information. In anticipation of this we have prepared a technique using focused ion beam microscopy to extract an...